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Tolerance Stack Analysis using GD&T

Seminar Content

This two-day course focuses on the application of tolerance stack-up analysis techniques to a wide variety of assemblies per the requirements of ASME Y14.5 and ISO 1101 (Geometric Dimensioning and Tolerancing, GD&T), from the very simple to the more complex situations commonly faced in industry today. Both plus/minus and geometrically toleranced assemblies are examined, with stack-up analysis taught and practiced on each. Many different tolerance layouts are discussed and analyzed. The concepts taught in this course are: loop analysis (also known as the vector method), number charting, virtual condition, resultant condition, inner and outer boundaries, minimum airspace, maximum wall thickness, maximum interference, minimum and maximum overall dimensions, the logic of stack-up analysis, and introduction statistical stacking (root-sum-square), and much more.

Who Should Attend

This seminar is designed for Design Engineers, Product Engineers, Quality and Technical Staff.

Recommended Training and/or Experience

Attendees should have a basic working knowledge of ASME Y14.5; completion of the GD&T Fundamentals class is recommended. A knowledge of GD&T principles is required to allow all participants to be successful in learning the techniques of tolerance stack-up analysis. Each participant should bring a hand-held calculator.

Seminar Materials

Each participant will receive a seminar manual with case studies and numerous spreadsheet exercises.

Seminar Goals

  • Use tolerance stacks to predict and control dimensional variation
  • Define and describe the different types of stacks and stacking methods
  • Set a stack goal and find an appropriate stack path for the goal
  • Apply the methodology to correctly calculate the stack
  • Correctly record coordinate, geometric, and modified geometric tolerances in the stack form
  • Select an appropriate statistical approach

Seminar Outline

  • How to Create Tolerances
  • GD&T Review
  • Stack Fundamentals
  • Assembly Stacks
  • Stacks with Location-Related Geometric Tolerances
  • Stacks with Profile Controls
  • Stacks with Form and Orientation Controls
  • Position Stacks with Modifiers
  • Statistical Stacks

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